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In the world of high-speed digital design, clock rates are increasing at
a dramatic pace. Gigabit per second data rates are creating signal
integrity problems for printed circuit board structures such as
backplanes, microstrip traces and interconnects. While simulation tools
allow helpful insights into predicting structure performance, more test
and measurement tools are needed to measure and verify the actual
response to fast edge speeds. Time Domain Reflectometry is one of
the tools used most frequently by digital design engineers to relate
physical interconnect structures to such parameters as characteristic
impedance, reflection coefficient, propagation velocity and edge effects.
a dramatic pace. Gigabit per second data rates are creating signal
integrity problems for printed circuit board structures such as
backplanes, microstrip traces and interconnects. While simulation tools
allow helpful insights into predicting structure performance, more test
and measurement tools are needed to measure and verify the actual
response to fast edge speeds. Time Domain Reflectometry is one of
the tools used most frequently by digital design engineers to relate
physical interconnect structures to such parameters as characteristic
impedance, reflection coefficient, propagation velocity and edge effects.
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