怎么使用DSOX2000示波器测量晶体启动时间

>我正在尝试使用示波器（DSOX2000）设置测量晶体振荡器启动时间的测试。
我使用单拍模式并且能够从开始获取信号但是示波器没有足够的内存来记录整个启动时间。
>>那么有人知道我是否可以设置门控测量或者如果可能的话如何降低示波器的分辨率？
当您更改示波器的水平设置时，它会自动进入最大深度，然后降低采样率。
您可以将范围设置为捕获多秒，但是当您这样做时，范围的BW会随着采样率的下降而下降。
只要您的采样率至少是晶体频率的5-10倍，您就应该能够很好地了解晶体的波形。
这是通过前面板“水平”部分中较大的旋钮完成的。“水平”部分中较小的旋钮（靠近“推到零”的位置）调整延迟。
如果将其向左转，则“实际”触发事件将从屏幕左侧移开，并且“显示的”触发点将保留在屏幕上。
例如，如果将示波器设置为每格5毫秒，并将水平调整为50毫秒，则“实际”触发器位于屏幕左侧25毫秒，时间从25毫秒到75毫秒（触发后）
在屏幕上。通过调整水平到各种值，你应该能够很好地了解水晶的启动情况。>谢谢你的任何想法。欢迎你.Al



     以下为原文

  > I am trying to setup a test to measure crystal oscillator startup time using oscilloscope ( DSOX2000). I used single shot mode and was able to get the signal from start but the scope did not have enough memory to record the whole startup time.
>
> So does anyone know if I can setup a gated measurement or some how reduce the resolution of the scope if possible ?

As you change the Horizontal setting of the scope, it automatically goes to maximum depth, then slows down the sample rate. You can set the scope to capture multiple seconds, but as you do that the BW of the scope drops, as the sample rate drops. As long as your sample rate is at least 5-10 times the frequency of your crystal, you should be able to get a good picture of the waveform of the crystal. This is done with the larger knob in the 'horizontal' section of the front panel.

The smaller knob in the 'horizontal' section (near where it says 'Push to Zero'), adjusts the delay. If you turn it to the left, the the 'actual' trigger event moves off the left of the screen, and the 'displayed' trigger point stays on the screen. If you set your scope, for example, to 5 msec per division, and adjust the horizontal to 50 msec, then the 'actual' trigger is 25 msec to the left of the screen, and the time from 25msec to 75msec (after the trigger) is on the screen.

By adjusting the horizontal to various values, you should be able to get a good picture of the startup of your crystal.

> Thanks for any idea.

You're welcome.

Al